Bruker launches robust ContourGT-I 3D Optical Microscope

Bruker announced the launch today of the ContourGT-I 3D Optical Microscope to enhance R&D productivity and maximize manufacturing throughput for industrial applications. The ContourGT-I has been optimized to accelerate and simplify measurement setup and feature-tracking and is the world's first bench top profiling system to incorporate Bruker's proprietary tip/tilt head design, along with fully automated functionality, including turret, lenses, and illumination. In addition, the system has been designed from top to bottom for maximum vibration stability and robustness, including a space efficient yet stable footprint with fully integrated air isolation. This combination of features and capabilities enables greater convenience and productivity in a host of markets, ranging from ophthalmics and medical device implants to precision machining and semiconductor manufacturing.

“By minimizing XY tracking errors and reducing feature location set-up time, ContourGT-I enables gage-capable 'measurement on demand.' Along with the ability to keep the sample in focus when switching magnification, this dramatically improves productivity in the lab and throughput on the production floor, translating directly into customer cost savings.”

"Based on over three decades of surface metrology and imaging excellence, customers know they can count on our 3D optical microscopes to provide the best Z-axis resolution, independent of magnification, as well as the fastest measurements with the largest fields of view on the most difficult surface geometries," said Mark R. Munch, Ph.D., President of the Bruker Nano Surfaces Division. "By adopting automation and tip/tilt head designs from our high-volume floor-mounted systems, the bench top ContourGT-I now offers these capabilities to industries that previously may not have considered 3D optical microscopes as affordable or easy to operate."

"The tip/tilt head design has proven invaluable in situations where the customer needs to characterize surface features over a range of angles," added Rob Loiterman, Executive Vice President and General Manager of Bruker's Stylus and Optical Metrology Business. "By minimizing XY tracking errors and reducing feature location set-up time, ContourGT-I enables gage-capable 'measurement on demand.' Along with the ability to keep the sample in focus when switching magnification, this dramatically improves productivity in the lab and throughput on the production floor, translating directly into customer cost savings."